Global Standards for the Microelectronics Industry
ESD: Electrostatic Discharge
JEDEC has taken a leadership role in developing standards for ESD since the early 1980s, including standards for device handling and test methods related to ESD. Below is a summary of useful standards and documents related to ESD.
Test Methods
- Published JEDEC standards include Joint JEDEC/ESDA Human Body Model (JS-001-2023) and Joint JEDEC/ESDA Charged Device Model (JS-002-2022).
Publications
- JEDEC publications related to ESD include JEP196: A Case for Lowering Component-level CDM ESD Specifications and Requirements Part II: Die-to-Die Interfaces; JEP193: Survey On Latch-Up Testing Practices and Recommendations for Improvements; JEP164: System Level ESD Part III: Review of ESD Testing and Impact on System-Efficient ESD Design (SEED); JEP178: ESD Sensitivity Testing – Reporting ESD Withstand Levels on Datasheets; JEP174: Understanding Electrical Overstress; JEP172A: Discontinuing Use of the Machine Model for Device ESD Qualification; JEP155B: HBM Target Levels; JEP157A: CDM Target Levels; JEP161: System Level Part 1 Overview; and JEP162A.01: System Level Part 2 Design Methods
ESD Handling
- JESD625: ESD Controls for Manufacturing and Handling
ESD Labeling
Technical Tutorials
Tutorial Name | Date |
---|---|
Charged Device Model (CBM) Qualification Issues - Expanded | 09/2022 |
Understanding Electrical Overstress | 05/2017* |
Human Body Model (HBM) Qualification Issues | 01/2014* |
Charged Device Model (CDM) Qualification Issues | 01/2014* |
Machine Model (MM) Qualification Issues -Discontinuing Use of the Machine Model for Device ESD Qualification |
01/2014* 01/2013* |
System Level ESD | 09/2013* |
System Level ESD - Expanded | 09/2013* |
ESD Control for Specification Levels | 09/2012* |
*Reaffirmed 05/2019
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