Global Standards for the Microelectronics Industry
Automotive Electronics Forum Tokyo: Agenda
Wednesday, November 16
Registered Attendee Check-in
Osamu Nagashima, JEITA
Mian Quddus, JEDEC Board of Directors
Kazuyoshi Tsukada, Memory Expert
|Automotive Memory: Driving Intelligent Mobility, while Fueling the Evolution of an Entire Industry|
Keynote Presenter: Hyunduk Cho, Samsung
Samsung foresees memory becoming one of the most critical pillars of change for the automotive industry, thanks to current and upcoming advancements in intelligent mobility, and is already playing a leading role in working to enable this. Automotive technology and the expanding automotive ecosystem demand not only massive amounts of data creation, but also an embrace of high performance operations. This necessitates a reshaping of Auto E/E architecture, which some equate to transforming it into the equivalent of a server on wheels. However, technology requirements for automotive applications have not yet fully aligned with the semiconductor business and its rapid technological evolution. Currently, the automotive business requires more cutting-edge technology to meet future intelligent automobile developments. Samsung believes that the memory industry can be the single most important catharsis for greater technological advancement. Memory, in fact, has been an incredible microcosm of innovation for decades, as can be seen in the Mobile, PC, and Server/Storage areas. We foresee such memory initiative will impact automotive technology and the automotive business much more than ever before, and at the same time, enable it to evolve more rapidly. In this talk, we are proposing a series of technology solutions that will accelerate the inevitable journey of the automotive business from horsepower to silicon power.
|Electronic Components for e-Mobility Architectures |
Keynote Presenter: Kirk Ouellette, ST
The adoption of electric vehicles brings with it a significant number of critical challenges that electronic component technology and architectures are poised to address. Due to their fast-switching speed Wide bandgap (WBG) devices like silicon carbide (SiC) or gallium nitride (GaN), open up major design opportunities for power conversion architecture such as for on-board charging and motor traction inverters, as well as for off-board charging and grid infrastructures. WBG performance in high voltage, high frequency and high efficiency is an ideal choice for automotive, but also can serve industrial applications by taking advantage and experience to address two different market volumes for a cost-effective solution. Better power density, reduced heat dissipation requirements, higher voltage levels to reduce currents and therefore the weight of the cables, their adoption is conditioned by improved processes to reduce the cost of ownership, by standardized qualification with a low environmental footprint. New component technologies provide system more efficient such as for battery management, when the new generations of processors address zoning (network by physical location rather than by function) and the resulting benefits in terms of security, cable weight, energy management and distribution, throughput and latency, services and architecture SW. In conclusion, only a holistic approach to the system by mastering the end-to-end environment can provide a global, optimized and sustainable solution.
Implementing ISO26262 Functional Safety (FuSa) Requirements for an LPDDR5X Memory Controller and PHY Subsystem
The next generation of high performance vehicle control systems will have the ability to process large amounts of sensor data with powerful algorithms and machine learning to provide autonomous or semi-autonomous driving ability. These control systems require a large amount of processing ability and high memory bandwidth, and LPDDR5X is an excellent choice of DRAM memory for this application. This presentation will discuss the functional safety targets required for an LPDDR5X Memory Controller and PHY subsystem intended for automotive applications, including quality process, Automotive Safety Features (ASF), error correction, built-in self test (BIST), Failure Mode, Effect and Diagonostic Analysis (FMEDA), Fault metrics, Safety Manual, and certification; all from the perspective of the implementer who will need to design the System-on-Chip (SoC) containing the LPDDR5X interface to the DRAM.
|Architecting Memory Solutions to Meet Rigorous Functional Safety Requirements |
Presenter: Robert Bielby, Micron
The growing momentum in the deployment of vehicles with increasing levels of ADAS is placing an ever increased focus on Functional Safety. Historically characterized by the ISO 26262 standard as a class II hardware element, Micron has disrupted the industry again through the introduction of the industry's first and only ASIL D qualified LPDDR 5 memory which accurately characterizes and supports systematic fault coverage, consistent with a class III hardware element. Through the introduction of this leadership product family, significant cost savings, risk reduction, and faster time to market can be achieved for the memory integrator vs. approaches historically employed to achieve requisite ASIL. Functional safety is an essential aspect of the development of advanced automotive systems, especially as the industry moves into advanced ADAS applications and autonomous driving. And an increased focus on functional safety on DRAM component, memory subsystem and automotive system levels will benefit will benefit automakers designing next generation vehicles. In this presentation, Micron will discuss JEDEC DRAM in the context of functional safety, with a focus on random and systematic fault mitigation.
|Interface Performance and Security for Automotive Code Storage|
Presenter: Stephan Rosner, Infineon
Automotive compute systems rely on low-latency nonvolatile memory (NVM) subsystems for fast boot and for fast access to applications. Embedded NVM (eNVM) with its inherently wide data paths offers not only high data rates of multiple GBytes/s, but also desirable security properties. eNVM capabilities are typically not supported in advanced process nodes below 2x nm. The transition of automotive MCUs to such nodes therefore requires to move eNVM off-chip while maintaining the required data rates of GBytes/s as well as protection for the information that is now located outside the well-secured MCU. This paper discusses a practical solution to this problem based on combining NVM with LPDDR4 technology. Furthermore, critical security challenges for moving eNVM to external memory are discussed.
|11:30-11:50AM||Case for Standardized Mission Profiles for Automotive|
Presenters: Peter Turlo, Onsemi
The transition from the legacy Internal Combustion Engine (ICE) to the contemporary Battery Electric Vehicle (BEV) automotive platforms resulted in the development of automotive electronic systems not previously employed in ICE applications. Along with proliferation of control systems supporting various functions related to sensing and connectivity resulted in an exponential growth of electronic content in contemporary automotive platforms that can be subjected to use conditions that can differ from the legacy use conditions originally developed for ICE platforms. Years of collective industry ICE platform knowledge enabled the standardization of the qualification procedures applied to automotive semiconductor products; facilitating an efficient and cost-effective semiconductor product development and qualification process supporting the deployment of (non-ASIC) catalog products destined for the general automotive market. Today, the multiple iterations of yet to be standardized contemporary use conditions provided by multiple endusers for similar end applications are causing inefficiencies in the product development and qualification. process. The presentation will speak to the concept of Standardized Mission Profiles as applied to some of the automotive applications seen in contemporary automotive platforms.
|11:50AM-12:10PM||LPDDR and Its Ever Changing Test Challenges for Automotive|
Presenters: Brig Asay, Keysight Technologies
As autonomous driving continues to take hold in the automotive market, increasingly automotive vendors are adopting to faster LPDDR technologies much earlier in the overall LPDDR technology life cycle. No longer can the automotive industry be satisfied with more stable, more mature technologies, but rather they must move quickly to adapt the faster technologies so they can be quicker in their deployment of the latest autonomous technologies. Of course faster adoption comes with many price tags and one that might not be top of mind is the fact that with faster technologies, comes an entirely new set of testing challenges. Test engineers now must understand how equalization, de-embedding and even receiver calibration must be done to successfully test tomorrow’s automotive designs. This lecture will discuss these testing challenges, various test equipment (BERT versus AWG) and what can be done to prepare your testing needs for next generation LPDDR technologies.
Aiming at a Collision-free Society - Advanced Driver Assistance and Automated Driving
Keynote Presenter: Yoichi Sugimoto, Honda R&D Co., Ltd.
Honda aims at zero traffic fatality globally by 2050. We keep working on continuous evolution of advanced driver assistance system (ADAS), including the world’s 1st Collision Mitigation Brake System (CMBS). To eliminate human errors, we have been developing automated driving technologies. The world’s 1st Level 3 automated driving was deployed in 2021.
|2:10-2:30PM||Advanced Imaging and Sensing Technologies in ADAS Systems|
Presenter: Tsutomu Haruta, Sony Semiconductor Solutions Corporation
The number of ADAS systems in the automotive industry using imaging technology is steadily increasing year over year to help make vehicles safer for drivers, passengers and pedestrians. Most current commercially available systems are based on CIS technology, but next generation systems are increasingly looking to adapt some level of depth sensing technologies. In this session, it will show you which image sensor characteristics are important in order to provide robust and reliable ADAS sensing systems from traditional CIS solutions, and also it will touch upon LiDAR depth sensing technologies.
|2:30-2:50PM||Market Trend and Digital Chassis Solutions Powered by Qualcomm|
Presenter: Toshiya Matsui, Qualcomm CDMA Technologies
"Manufacturing", "Sales & Maintenance", "Evolving Consumer Expectations", "In-Car Experiences" and the search for new revenue generators.
|2:50-3:10PM||Introduction of Automated Shuttlebus in Campus|
Presenter: Manabu Omae, Keio University
An automated shuttlebus practically operated in the campus of Keio University is introduced. The steering and speed of the shuttle bus are controlled based on precise digital map and localization using RTK-GNSS and LiDAR sensors. The current level of the autonomous-driving shuttle bus is Lv.2, and we are challenged to raise the level to Lv.4 by 2025. In the presentation, vehicle control of the automated shuttle bus is introduced. Low computational load for the control is realized by the use of precise map information stored as raster data.
|3:30-3:50PM||An Advanced Transient Thermal RC model for prediction of Junction and Measurement points |
Presenter: Takuya Shinoda, Denso Corporation
The thermal design issues of electronic control products in the automotive industry are presented, and the transient thermal (RC) model is introduced as one of the industry standard models for the future of design in thermal analysis. The model for heat transfer analysis can be verified to respond to electronic control specifications by calculating junction temperatures with high accuracy. The model is produced with two types of thermal resistance data. These data are the manufacturer's guaranteed values and the measured transient thermal resistance values.
|3:50-4:10PM||Contribution of Power Semiconductors to Social Challenges Toward Zero Emissions|
Presenter: Gentaro Ookura, Toshiba Electronic Devices & Storage Corporation
In recent years, the automotive industry has been undergoing technological innovation in the four megatrends of CASE (Connected, Autonomous, Sharing, and Electric). In this context, the trend toward zero emissions among OEMs is further accelerating following the COP26 resolution held in Glasgow last year, and the automotive industry's efforts to reduce CO2 emissions are expected to expand the number of xEV (B-EV, PHEV , HEV and 48 VMHEV).
|4:10-4:30PM||Automotive Memory IP – Building the Car of Tomorrow|
Presenter: Brett Murdock, Synopsys Inc.
New trends, the shift to zonal architecture, and use of AI is reshaping Automotive SoCs, requiring more compute processing performance. Such transitions are requiring faster data movement for applications such as ADAS and in-vehicle communication, increasing the need for high-speed interfaces. This presentation will describe the new automotive trends, outline the automotive requirements for functional safety, reliability and quality, and discuss options and challenges for the latest memory technologies to be used in the automotive environment.
|Storage Trend in Automotive Systems and KIOXIA's Strategies|
Presenters: Tetsuya Yamamoto, KIOXIA Corporation & Isao Yamamoto, KIOXIA Corporation
To improve vehicle safety, effectiveness & customer experiences, installing “Connected” & “ADAS” are becoming more in demand. In other words, it means the vehicle itself is more “intelligent” by adopting IT-based technologies.
Presenter: Takashi Yamada, JEITA
Session details coming soon.
Program, topics and speakers subject to change without notice.