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Standards & Documents Search: JC-22: Diodes and Thyristors
Results 1 - 20 of 26
Results
| Title |
Document # |
Date |
|---|---|---|
| ADDENDUM No. 1 to EIA-318 - CHARACTERIZATION OF A REVERSE TEST FIXTURE: SUPERSEDED BY EIA-318-B, July 1996.Status: Rescinded | EIA318-1 | Feb 1981 |
Committee(s): JC-22.4 Free download. Registration or login required. |
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| MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES:Status: Reaffirmed | EIA318-B | Jul 1996 |
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement. Committee(s): JC-22.4 Free download. Registration or login required. |
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| AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES:Status: Reaffirmed February 1972, November 2002 | EIA323 | Mar 1966 |
This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device. Committee(s): JC-22.1 Free download. Registration or login required. |
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| RECOMMENDED STANDARD FOR THYRISTORS: | EIA397 | Jun 1972 |
One section of this standard presents a thorough explanation of thyristor principals, defining thedifferent classes of these devices, their Physical structure and detailing the numerous test methods and ratings required in their application to electronic and power circuitry. Another section presents a universally accepted listing of letter symbols. Considerable effort is devoted to the use of JEDEC Type Registration System as related to thyristors. This will permit the device manufacturer to employ a uniform procedure in the development of maximum rating and presentation of performance data. Committee(s): JC-22.1 Free download. Registration or login required. |
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| ADDENDUM No. 1 TO EIA-397: | EIA397-1 | Jul 1980 |
A compilation of 12 new or revised thyristor test methods which have been adopted since the original standard was issued in 1972. Committee(s): JC-22.1 Free download. Registration or login required. |
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| FORWARD TURN-ON TIME MEASUREMENT ON SEMI-DIODES - INCORPORATED INTO EIA-282-A.Status: Rescinded | JEP87 | Jan 1992 |
Committee(s): JC-22.2 |
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| THERMAL RESISTANCE AND THERMAL IMPEDANCE TEST METHODS FOR STUD AND BASE-MOUNTED RECTIFIER DIODES AND THYRISTORSStatus: Rescinded | JEP88 | Jan 1974 |
Committee(s): JC-22.1 |
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| THERMAL RESISTANCE FOR TEST METHODS FOR SIGNAL DIODES - SUPERSEDED BY EIA-531, July 1986. See JESD531, April 2002.Status: Rescinded | JEP90 | Sep 1983 |
Committee(s): JC-22.4 Free download. Registration or login required. |
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| SEMICONDUCTOR POWER CONTROL MODULES:Status: Reaffirmed June 1992, April 1999, April 2002 | JESD14 | Nov 1986 |
Semiconductor Power Control Modules (SPCM) are modules consisting of thyristors or transistors, or both, as the primary controlling elements. Methods of manufacture of semiconductor power control modules include the assembling of individual components and the use of semiconductor hybrids or monolithic processing technologies, or both. Committee(s): JC-22.2 Free download. Registration or login required. |
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| AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS | JESD210 | Dec 2007 |
This standard is applicable to avalanche breakdown diodes when used as a surge protector or transient voltage suppressor (TVS). It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. This standard may be applied to other surge-protection components with similar characteristics as the ABD. Committee(s): JC-22.2, JC-22.5 Free download. Registration or login required. |
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| ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING | JESD211 | Dec 2009 |
This standard is applicable to diodes that are used as voltage regulators and voltage references. It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. Free download. Registration or login required. |
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| SILICON RECTIFIER DIODES: | JESD282B.01 | Nov 2002 |
This standard provided definitions, electrical characteristics circuit technology, letter symbols and registration format for diodes and stacks. It also covers rating and characteristics, manufacturing and performance as well as test practices to demonstrate the performance of semiconductor rectifier diodes and rectifier stacks used for the conversion and/or control of electric power. This version contains minor revisions to JESD282-B, April 2000. This document formerly known as EIA-282-A (February 1990), ANSI/EIA-282-A-1989. Committee(s): JC-22.2 Free download. Registration or login required. |
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| STANDARD FOR MEASURING FORWARD SWITCHING CHARACTERISTICS OF SEMICONDUCTOR DIODES:Status: Reaffirmed April 2005 | JESD286-B | Feb 2000 |
This method updates the standard procedure for characterizing the switching of signal or switching diodes when a step function of forward current is applied. The objective is to provide a standard so that accurate comparisons can be made. Formerly known as EIA-286-A (February 1991), ANSI/EIA-286-A-1991. Became JESD286-B after revision, February 2000. Committee(s): JC-22.4 Free download. Registration or login required. |
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| VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT:Status: Reaffirmed January 1992, April 1999, April 2002 | JESD307 | May 1965 |
This standard is intended to cover the measurement of noise voltage in voltage regulator diodes in the reverse breakdown region. It describes noise voltage measurements at specified conditions, but may be used as a guide for making such measurements at other than specified conditions. Formerly known as RS-307 and/or EIA-307 Committee(s): JC-22.4 Free download. Registration or login required. |
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| CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS:Status: Reaffirmed April 1999, April 2002 (Original publication July 1965) | JESD320-A | Dec 1992 |
This standard provides guidance for achieving equilibrium when measuring temperature sensitive static parameters of signal diodes. Formerly known as EIA-320-A. Committee(s): JC-22.4 Free download. Registration or login required. |
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| METHOD OF DIODE Q MEASUREMENT:Status: Reaffirmed April 1999, April 2002 | JESD381-A | Nov 1981 |
This standard was updated and revised for the purpose of clarifying the method used to measure Q of a Voltage-Variable-Capacitance Diode in the low VHF range using an RF admittance bridge. Originally published November 1981. Approved as ANSI/EIA-381-A-1992, July 1992. Became JESD381-A after ANSI expiration July 2002. Committee(s): JC-22.4 Free download. Registration or login required. |
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| DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES:Status: Reaffirmed January 1991, April 1999, April 2002 | JESD4 | Nov 1983 |
This standard defines reference distances between terminals of the device and the external package at specific voltages. Committee(s): JC-22.2 Free download. Registration or login required. |
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| REVERSE RECOVERY CHARACTERISTICS OF SILICON DIODES: RESCINDED June 2002.Status: Rescinded | JESD41 | May 1995 |
Committee(s): JC-22.1 Free download. Registration or login required. |
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| MEASUREMENT METHOD FOR THERMAL RESISTANCE OF BRIDGE RECTIFIER ASSEMBLIES: RESCINDED, June 2002. Replaced by JESD282-B.Status: Rescinded June 2002 | JESD45 | Dec 1994 |
Committee(s): JC-22.2 Free download. Registration or login required. |
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| LIST OF PREFERRED VALUES FOR USE ON VARIOUS TYPES OF SMALL SIGNAL AND REGULATOR DIODES:Status: Reaffirmed April 1999, April 2002 | JESD482-A | Aug 1984 |
This standard specifies preferred values to be used on signal and regulator diodes. It will facilitate the standardization for nominal values used on small signal regulator diodes previously established in JEDEC Suggested Standard No. 2. Formerly known as EIA-482-A Committee(s): JC-22.4 Free download. Registration or login required. |
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