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Standards & Documents Search: jep157, JC-14.3: Silicon Devices Reliability Qualification and Monitoring
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| Title | Document # | Date |
|---|---|---|
| RECOMMENDED ESD-CDM TARGET LEVELS | JEP157 | Oct 2009 |
This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD CDM level requirements. Free download. Registration or login required. |
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