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Title Document # Date
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)Status: Superseded by ANSI/ESDA/JEDEC JS-001, April 2010. JESD22-A114F Dec 2008

This test method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic Human Body Model (HBM) discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed.

Committee(s): JC-14.1

See JESD22-A114F information
SOLDERABILITY TESTS FOR COMPONENT LEADS, TERMINATIONS, LUGS, TERMINALS AND WIRES: Removed 01/21/04 J-STD-002B Feb 2003

At the request of IPC, J-STD-002B has been temporarily removed from the free download area until such time when it is revised to include lead-free

In its place, JEDEC's Test Method, JESD22-B102, Solderability, which includes lead-free, is available for free downloading

Committee(s): JC-14.1, JC-13

See J-STD-002B information
Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600 JESD79-3-1 Jul 2010

The JESD79-3 document defines DDR3L SDRAM, including features, functionalities, AC and DC characteristics, packages, and ball/signal assignments with the exception of what is stated within this standard. The purpose of this standard is to define the DDR3L specifications that supersede the DDR3 specifications as defined in JESD79-3. The use of DDR3-800, DDR3-1066, DDR3-1333, and DDR3-1600 titles in JESD79-3 are to be interpreted as DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600, respectively, when applying towards DDR3L definition; unless specifically stated otherwise.

Committee(s): JC-42.3, JC-42

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