Standards & Documents Search

Click a term to initiate a search.

Keywords

(F)-PDSO (1)
0.3 V (1)
0.40 mm pich (1)
0.80 mm pitch (2)
1 Rank (1)
1-Bit (1)
1.2 V (3)
1.25 V (1)
1.5 V (2)
1.5 V Interface (1)
1.8 V (2)
100 pin (2)
1066 (1)
112 pin (1)
128 Mb (1)
135.01 (1)
14 Lead (1)
144 pin (7)
16 Lead (1)
16-Bit Logic (1)
1625.04C (1)
1640.11 (1)
168 Pin (5)
1680.12 (1)
16859 (1)
172 pin (1)
1723.02 (1)
1749.01 (1)
1756.05 (1)
184 Pin (6)
184-Pin (1)
2-Bit (1)
2-R (1)
2.5 V (1)
200 (1)
200 pin (3)
204 pin (1)
204-Pin (1)
2065.25 (1)
2065.26 (1)
2077.07 (1)
2082.22B (1)
2082.24B (1)
2082.28B (1)
2082.29B (1)
2082.38A (1)
2082.56B (1)
2082.59 (1)
214 pin (2)
2145.06A (1)
2145.12A (1)
2145.13B (1)
2145.22 (1)
2156.06 (1)
2156.07 (1)
2156.08 (1)
2159.02 (1)
2202.00 (1)
240 pin (10)
240-Pin (2)
244 Pin (2)
278 Pin (1)
2D (1)
3 lead (1)
3 Leads (1)
3-Bit (1)
3.3 V (1)
32-Bit Logic Functions (1)
32869 (1)
3D (1)
4.2 (2)
4.3 (1)
4.4 (1)
48 Lead (1)
5 V Tolerant - CMOS Devices (1)
54 Ball Package (1)
64 pin (1)
72 pin (3)
72-bit (1)
8 lead (1)
8-Bit (1)
8.89 mm Body (1)
80 Pin (1)
Abbreviations - Packages (1)
ABD (1)
AC (1)
Accelerated (1)
Accelerated Moisture Resistance (2)
Accelerated Stress Test (1)
Accelerated Test (1)
Acceleration Factor (3)
Acceleration Models (1)
Acceptance (1)
Acoustic Microscopy (1)
Acronyms - packages (1)
Activation Energy (3)
ADC (1)
Address Parity (1)
Addressing (1)
Administrative Quality Problems (1)
Advanced Memory (1)
Advanced memory Buffer (2)
AFR-PDSB (1)
Air Convection Cooled Life Test (1)
AlCu (1)
alpha (2)
Alpha Particles (1)
AMB (4)
AMB Component Specification (1)
americium (1)
Analysis - Heat Flow (1)
Analysis fo Censored Data (1)
Analyzer (1)
Annex (10)
Annex A (1)
Application (1)
Application Specific (1)
Applications - Rugged (1)
Architectural Operational (1)
Architecture (1)
Archive (1)
Area Array (1)
Array (2)
ASIC (1)
Assembled Solid State Surface-Mount Components (1)
Assemblies (1)
Assembling - Individual Components (1)
Assembly (1)
Assessing Compliance (1)
Assessment (2)
Assessment - Average Outgoing Quality (1)
Assessment - Electrical Parameter (1)
Assessment Techniques (1)
Audit Checklist - Preparation (1)
Avalanche (2)
Avalanche Switching (1)
Average Outgoing Quality (1)
B Series - CMOS Devices (1)
B1FR-XBGA (1)
Backside (1)
Ball (4)
Ball Bond (1)
Ball Grid (1)
Ball Grid Array (25)
Ball Grid Array Pinouts (1)
Ball out (1)
Banks (1)
Bar Code (1)
Bare Die (1)
Barrier Materials (1)
Basband (1)
Baseband (1)
BBIC (1)
BDDR (1)
Beaded (1)
Beam (1)
Benchmark Set - Cell Based Integrated Circuits (1)
Bend (2)
BEOL (1)
Beta (1)
BFR (1)
BFR-XBGA (1)
BGA (43)
BGA brittle fracture (1)
Bi-directional (1)
Bias (1)
Bias Life (2)
BIC (1)
BiCC (1)
BiCMOS (1)
BiCmos Logic Devices (3)
Bipolar (2)
Bipolar Logic Pinouts (1)
Bipolar Transistors (1)
Bipolar Transistors - Insulated Gate (1)
Bit Wide (2)
Bit Write (1)
Board level (1)
Board-level (1)
Bond Wire - Modeling (1)
boot (1)
Boot Mode (1)
Bottom Side Board Attach (1)
Breakdown (1)
Bridge Rectifier Assemblies (1)
Brominated Flame Retardant (1)
Buffer (7)
Buffered (3)
Buffered SDRAM (1)
Bump (2)
Bumped (2)
Burst (1)
Bus (1)
Bus Switch (5)
Byte Wide (5)
Byte Wide PROM (1)
Byte Wide ROM (1)
C-Bend (1)
Calculation - ELFR (1)
Calibration Procedure - Solar Cells (1)
Capacitance - Transistor (1)
Capacitance Model (1)
Capacity (2)
card (2)
Cards (1)
Catastrophic Failure (1)
Cavity (1)
CBGA (2)
CDCV857 (1)
CDM (2)
Cell Based - Integrated Circuits (1)
Cells - Photoconductive (1)
Center Tap Terminated - CTT (1)
ceramic (6)
Ceramic Package (2)
Certification (1)
Certification - PIND Testing (1)
CFI - Common Flash Interface (2)
CFR (1)
Chain Description File (1)
Change Record (1)
Changes (1)
Character Designation - LCD (1)
Characteristics (1)
characterization (4)
Characterization - Hybrid Polymeric Materials (1)
Charge Pump (1)
Charged Device Model (1)
Charged Device Model (CDM) (1)
CHC (1)
Chip - Thermal Test (1)
Chip Carrier (2)
Chip Carrier - Leadless Pinouts (1)
Chip Carrier Pinouts (1)
Chip Carriers (1)
Chip Pull (1)
Chip Scale (1)
chip-to-package (1)
Chlorinated Flame Retardent (1)
Chop (1)
Circuit Support Films (1)
Class B Microcircuits (1)
Classification levels (1)
Classifications (1)
Clearance Distance (1)
Clock (1)
Clock Driver (4)
Clock Rate (1)
CMOS (8)
CMOS Devices (2)
CMOS Devices - 4000 (1)
CMOS Devices - B Series (1)
CMOS Devices - Fast (1)
CMOS Devices - Gate Array (1)
CMOS Devices - High Speed (1)
CMOS Devices - Semicustom ICs (1)
CMOS Interface (1)
CMOS Logic Device - TTL Compatible - CMOS Logic Devices (1)
CMOS Logic Devices (4)
CMOS Logic Devices - 1.8 V (1)
Collector-Base Time Constant (1)
Color Coding (1)
Column (1)
Commercial Practices (1)
Commercial Semiconductor Devices (1)
Common Flash Interface - CFI (1)
Common-Emitter Input (1)
Compact (2)
compact thermal model (1)
Compact Thermal Modeling (1)
Compliance (1)
component (3)
Component Assembly (1)
Component Leads (1)
Component Obsolescence (1)
Component Quality Problem (1)
Component Surface (1)
Components (2)
Composition (1)
Conduction Cooled Power Transistors (1)
Configurable Communication Voltage (1)
Connection (1)
Connector (3)
Connenctor (1)
Control Inputs (1)
Conversion (1)
Coplanarity (3)
Coplanarity Gauge (1)
Coplanarity Test - Surface Mount Devices (1)
Copper Pillars (1)
Corner Terminals (1)
Corrective Action Requirements (1)
Corrosion (1)
cosmic (1)
Cosmic Rays (1)
Covers (1)
Covers - Metal Package (1)
CQFP (1)
Cre Measurement (1)
Creepage Distance (1)
CSP (2)
CU2A877 (1)
CU878 (1)
CUA845 (1)
CUA877 (1)
CUA878 (1)
Current Density (1)
Current-Carrying Capability (1)
Customer Notification (1)
Customer-Supplied Background Information (1)
CVF857 (1)
Cycle (1)
Cycling (2)
DAC (1)
Dat Security (1)
Data Converters (1)
Data Format (1)
Data Matrix (1)
Data Retention (1)
Data Sheet Disclaimers (1)
Data Transfer Format (1)
DC (2)
DC Condition (1)
dc Interface (1)
DC Interface Parameters (1)
DC Stress (2)
DDR (33)
DDR - Double Data Rate (1)
DDR DIMM (1)
DDR SDRAM (1)
DDR2 (45)
DDR2 Interface (1)
DDR2 SDRAM (1)
DDR2-1066 (1)
DDR2-667 (1)
DDR2-800 (1)
DDR2. RDIMM (1)
DDR200 (2)
DDR266 (2)
DDR3 (41)
DDR3 RDIMM (1)
DDR3 Registered DIMM (1)
DDR333 (1)
DDR3L (3)
DDR3U (2)
DDR400 (1)
DDR533 (1)
DDRII (4)
Declaration (2)
Definitions (2)
DELPHI (1)
Delta Base-Emitter Voltage Method (1)
Delta Source-Drain Voltage Method (1)
Derating (1)
Description - Fast CMOS TTL Compatible Logic (1)
Description - Problem Solving Tools (1)
Design (8)
Design - Testability (1)
Design Considerations (1)
Design Guide (1)
Design Guide - QFN (1)
Design Requirements (1)
Design Requirements - Leaded Surface Mount (1)
Design Specification (2)
Designation of Units - Multiple Unit Devices (1)
Designation System (1)
Dessicant (1)
Detect (3)
Detectors - Infrared (1)
device (5)
Device Interchageability (1)
Device Specification - BiCMOS Logic Devices (1)
Device Type (1)
Devices (1)
Diagnostic (1)
Dictionary (1)
Die (1)
Die Size (1)
Die Temperature (1)
Die-Size (1)
DIELECTRIC BREAKDOWN (2)
dielectric reliability (1)
Differences (1)
Digital Circuits (1)
Digital ICs (1)
Digital Integrated Circuits - High Speed Interface (1)
Digital Parallel (1)
Digital Pinouts (1)
DIM (2)
Dimension (1)
DIMM (62)
DIMM Family (1)
Diode (1)
Diode Safe Operating Area (1)
Diodes (1)
Diodes - Forward Switching Characteristics (1)
Diodes - Noise Voltage Measurement (1)
Diodes - Preferred Values (1)
Diodes - Q Measurement (1)
Diodes - Reverse Recovery Time (1)
Diodes - Signal and Regulator (2)
Diodes - Silicon Rectifier (1)
Diodes - Thermal Equilibrium Conditions (1)
DiP (3)
DIP to SO Conversion (1)
Dipole (1)
Direct Attach Type Packages (1)
disc (1)
Discharge (1)
Disclaimers (1)
Discontinuance (1)
Discrete (2)
Discrete Semiconductor Packages (1)
Distributor Requirements (2)
Distributor Requirements - ESD Handling (1)
Dose Rate - Power MOSFETs (1)
Double (1)
Double Data Rate (3)
Double Data Rate (DDR) (1)
Double Data Rate - DDR (1)
DQS (1)
Drain-Source Diodes (1)
DRAM (22)
Drop Test (1)
DSBGA (5)
DSBGA footprint (1)
Dual (16)
Dual in-line (1)
Dual Inline (1)
Dual Pitch (3)
Dual Row (1)
Dual-Row (1)
Dual-Supply Volatage (1)
Dutycycle (1)
DWORD (1)
e-MMC (1)
Early Life - Failure Rate Calculation (1)
ECC (4)
ECL (2)
ECL - Emitter-Coupled Logic (1)
EDO-DRAM (1)
EE1002 (1)
EE1002A (1)
EEPROM (6)
Effects (1)

EIA-282 (1)
EIA-284 (1)
EIA-286 (1)
EIA-554 (1)
EIA-625 (1)
EIA-659 (1)
EIA-671 (1)
Eight Byte (1)
electrical (3)
Electrical Characteristics (1)
Electrical Characterization (1)
Electrical Levels - B Series CMOS Devices (1)
Electromigration (7)
Electronic (1)
Electronic Components (1)
Electronic Components - Management System (1)
Electronic Package (1)
Electronic Products (1)
Electroplated (1)
Electrostatic (1)
Electrostatic Discharge (1)
ELFR - Early Life Failure Rate (1)
EM (2)
Embedded (2)
embedded memory device (1)
Emitter-Coupled Logic - ECL (1)
eMMC (9)
eMMC 4.1 (1)
Encapsulated Electronic Components (1)
Encapsulated Microcircuits (1)
End Protrusion (1)
End Protrusion. R-PDSO-G (1)
Endurance (2)
Endurance and Data Retention Test (1)
Enhanced (1)
Enlarged Pitched (1)
Environment of Life Test for Lead-Mounted Devices (1)
Environmental Acceptance (1)
Environmental Conditions (1)
Environmental Conditions - Forced Convection (1)
EP-7 (1)
EP18 (1)
EP2-2100 (1)
Equivalent Noise Voltage (1)
error checking (1)
Error Rate (1)
ESD (6)
ESD - Charged Device Model (1)
ESD - Electrostatic Sensitive Device (2)
ESD - Symbol and Label (1)
ESDRAM (1)
ESDS Devices (1)
evaluation (2)
Evaluation - Polymeric Materials (1)
Exposed pads (2)
External (1)
External Interconnect (1)
External Visual (1)
Extra (2)
Extra Thin (1)
Extraction (3)
Extremely Thin (5)
F-PSON (1)
F-XBGA (1)
Failure (2)
Failure Analysis (2)
Failure Analysis - Report Format (1)
Failure Analysis Laboratory (1)
Failure Mechanism (2)
Failure Mechanisms (1)
Failure Mode (1)
Failure Mode - Ball Shear (1)
Failure Models (1)
Failure-Mechanism-Driven (1)
Failures in Time (1)
Fast Lock (1)
FB (2)
FB DIMM (1)
FB-DIMM (11)
FBD (8)
FBDIMM (11)
FBGA (6)
Features (2)
Feed Through (1)
FET (1)
FET Life Testing (1)
FET Switch (1)
FETs - Field Effect Transistors (1)
FETs - Lead Configuration (1)
FIBGA (1)
Field Programmable Devices (1)
File Naming (1)
Fine (2)
Fine picth (1)
Fine Pitch (29)
Fine Profile (1)
Fine-Pitch (5)
Finish Materials (1)
Finite Population Analysis (1)
FIT (1)
FITs (1)
Flange (5)
Flange Mounted (4)
Flange-Molded (2)
Flash (8)
Flash Drive (1)
Flash Families (1)
Flat (13)
Flat Index (2)
Flat Lead (1)
Flat Leads (1)
Flatness (1)
Flatpack (3)
Flex-based (3)
Flip Chip (1)
flip-chip (1)
Flourescence (1)
FMEA - Failure Mode Effects Analysis (1)
Force (1)
Forced Convection (Moving Air) (1)
Forward Current Transfer Ratio (1)
Forward Switching Characteristics (1)
Forward Voltage (1)
Foundry (1)
Four Byte (1)
Fracture Energy (1)
Frequency (1)
Frequency Variable (1)
Fron End (1)
Front End (1)
Full Body (1)
Full-Pak (1)
Fully (2)
Fully Buffered (5)
Fully Buffered DIMM (1)
Functional description (1)
Functional Failure (1)
functionality (1)
GaAs FETs (2)
GaAs Power FETs (1)
Gas (1)
Gas Analysis (1)
Gate (1)
Gate Array (2)
Gate Array - Performance (1)
Gate Burrs (1)
Gate Charge (1)
Gate Current (1)
GATE DIELECTRICS (1)
Gate Oxide Integrity (1)
Gate Resistance - Power MOSFET (1)
Gating Microcircuits (1)
Gauge (5)
Gaussian (1)
GDDR2 (1)
GDDR3 (2)
GDDR4 (2)
GDDR5 (3)
General Requirements (1)
Government Contractors (2)
Graphics (2)
Grid (2)
Grid Array (5)
Growth (2)
Gullwing (1)
Gunning Transceiver Logic - GTL (1)
H(U (1)
H(V (1)
H-PQFN (1)
Half-period Jitter (1)
Halogen (1)
Handheld electronics (1)
Handheld Products (1)
handling (18)
hardness (1)
HAST (1)
HBM (2)
HCI (1)
HE-PDFP-N (1)
HE-PQFP-N (1)
Header (3)
Header Family (2)
Heat Sink (1)
Heat Spreader (1)
Heavy Ion Irradiation (1)
Hermetic Packages (1)
Hermeticity (1)
high capacity (3)
High Density (1)
High Profile (2)
High Reliability (1)
High Speed (2)
High Speed - CMOS Devices (1)
High Speed Interface - Digital Integrated Circuits (2)
High Speed Transceiver Logic - HSTL (1)
High Temperature (1)
High Temperature Storage (1)
High-speed (1)
High-Speed - CMOS Devices (2)
Highly Accelerated Temperature and Humidity (1)
HL-PQFN (1)
Hot Carrier (2)
Hot Carrier Induced Degradation (1)
Hot Carrier Integrity (1)
Hot Electrons (1)
How to (1)
HP-VFQFP-N (2)
HP-VFQFP-NB (1)
HP-WFQFP-N (1)
HP-WFQFP-NB (1)
HR-PSFM-G (1)
HSTL (1)
HSUL (1)
HTDR (1)
Hub (1)
Human Body Model (1)
Humidity (1)
HV-PQFP-N (1)
HVF-PQFN (3)
HW-PQFP-N (1)
HWF-PQFN (1)
Hybrid (1)
Hybrid Microcircuits (1)
Hybrid Microelectronic Applications (1)
Hybrid Polymeric Materials (1)
Hybrids (1)
I/O (3)
I/O Drivers (1)
I/O Interface (1)
IC (1)
ID (1)
IDEMA (1)
identification (1)
Identification Code (1)
Identification Codes - CFI (1)
IEEE 802.11n (1)
Impedance (2)
In-line (2)
In-Process Data (1)
Increased Lead (1)
Index (1)
Index of Terms (1)
Inductance Model (1)
Information Requirements - Qualification of Silicon Devices (1)
Infrared - Detectors (1)
ink (1)
Inline (3)
Input (1)
Input and Output - 5 V Tolerant (1)
Input and Output - CMOS Tolerant (1)
Input Capacitance (1)
Insertion (4)
Insertion Force (1)
Insertion Force Gauge (1)
Inspection (2)
Instrumentation Chip (1)
Insulated (1)
Insulated Gate Bipolar Transistors (IGBT) (1)
Integrated Circuit Thermal Measurement (1)
Integrated Circuits (2)
Integrated Circuits - Cell Based (1)
Integrated Circuits - Interface Levels (1)
Inter/Intra-Metal Dielectric Integrity (1)
interaction (1)
Interconnect (1)
Interconnect Reliability (1)
Interconnects (1)
Interface (4)
Interface Levels - 5 V Operation (1)
Interface Levels - ECL (1)
Interface Levels - Integrated Circuits (1)
Interface Standard - Semicustom ICs (1)
Interlead Flash (1)
Internal (2)
Internal Stacking Module (1)
Interoperability (1)
Interstitial (1)
Introduction (2)
IO (1)
Ionization (1)
IR - Infrared (1)
IR Thermal Imaging (1)
ISM (2)
Isothermal (1)
ISP Chain Device (1)
J- Lead (1)
J-Lead (1)
JC-65 (1)
JCB-08-16 (1)
JCB-08-47 (1)
JCB-08-83 (1)
JCB-08-88 (1)
JCB-09-04 (1)
JCB-09-05 (1)
JEDEC Committees (1)
JEDEC Manual (1)
JEDEC Type Registration - Outline Drawings (1)
JEP-108 (1)
JEP95 (2)
JESD15 (1)
JESD209 (1)
JESD219 (1)
JESD21C (2)
JESD29 (1)
JESD79 (1)
JESD79-3 (1)
JESD79-4 (1)
JESD9 (1)
JESD96 (1)
Jitter (2)
JTAG (1)
Junction Temperature (1)
Junction-to-Board (1)
Knowledge Based (1)
Known Good Die - KGD (1)
L-PDSO (1)
Label - Electrostatic Sensitive Devices (1)
Labeling (1)
Labels (1)
Labels - Moisture Sensitive (1)
Land (1)
Laser (1)
Latch-up (1)
Latchup (1)
Lead (Pb) (1)
Lead (Pb) Free (1)
Lead Configuration - FETs (1)
Lead Content (1)
Lead Integrity (1)
Lead Mounted (1)
Lead Temperature - Transistor (1)
Lead-Free (1)
Leaded (1)
Leadframe-Based (2)
Leadless Pinouts - Chip Carriers (1)
LED (2)
Legibility (2)
Letter Symbols (2)
LF (1)
LF-XBGA (3)
LFBGA (1)
LFR-XBGA (2)
LGA (2)
Lidded Ceramic (1)
Lids (1)
Life Test (2)
Life Testing - Lead Mounted Semiconductor Devices (1)
Linears (1)
Liquid Crystal Devices - LCD (1)
Lock (1)
Logic (3)
Logic Circuits - HC and HCT (1)
Logic Device Programmer (1)
Logic Functions (2)
Logic Gating Microcircuits (2)
Logic Interface Levels - CMOS (1)
Logic Switching (1)
Lognormal Analysis (1)
Long-Term (1)
Low (1)
Low Frequency - Power Transistors (1)
Low Power (4)
Low Power CMOS (1)
Low Power Transistors (1)
Low profile (13)
Low Temperature (1)
Low Temperature Storage Life - Test Method (1)
Low Voltage (1)
Low Voltage - CMOS Devices (1)
Low Voltage - CMOS Logic Devices (1)
low-k (2)
Low-speed (1)
LPDDR (3)
LPDDR2 (4)
LPDDR2-NVM (1)
LPDDR2-SDRAM (1)
LPDDR3 (1)
LRDIMM (2)
LSOP (1)
LTDR (1)
Lugs (1)
LVCMOS (3)
LVCMOS-Compatible Circuits (1)
LVTTL (2)
LVTTL-Compatible Circuits (1)
MAC (1)
machanical (1)
Machine Model (1)
Macrocell Types (1)
Management - Component Obsolescence (1)
Manufacturers (1)
Manufacturers Identification Code (1)
mark (1)
Marking (2)
Marking Permanency (1)
Master (1)
Material (1)
Material Composition (1)
Matrix (1)
Matrix Tray (2)
maverick (1)
Maverick Product Elimination (1)
Maximum Ratings - Power Transistors (1)
MCM (2)
MCP (4)
MCP. Multichip (1)
Measurement (4)
Measurement - Diode Static Parameters (1)
Measurement - dv/dt During Reverse Recovery (1)
Measurement - Package Inductance/Capacitance Model Parameters (1)
Measurement - Power Device Turn-Off Switching Loss (1)
Measurement - Reverse Recovery Time (1)
Measurement - Reverse Recovery Time (trr) (1)
Measurement - Scattering Parameters (1)
Measurement - Small Signal HF (1)
Measurement - Small Value Transistor Capacitance (1)
Measurement - Static and Dynamic (1)
Measurement - Temperature Coefficient (2)
Measurement - Thermal Resistance (1)
Measurement - Thermal Resistance of GaAs FETs (1)
Measurement - Transistor Capacitance (1)
Measurement - Transistor Lead Temperature (1)
Measurement - Transistor Noise (1)
Measurement of Cre (1)
Measurement Procedures (1)
Measuring Whisker (1)
Mechanical (1)
Mechanical Shock (2)
Mechanical Shock - Subassembly (1)
memory (13)
Memory Buffer (1)
Memory Integrated Circuits (1)
Memory Integrated Circuits - Symbols (1)
Memory Module (6)
Memory Modules (1)
Metal Enclosures (1)
Metal Voiding (1)
Metallization Lines (2)
Methodology (2)
Metric (1)
Metrication (1)
Mezzanine (2)
Micro (3)
Micro DIMM (1)
Micro Size (1)

microcircuits (1)
Microcircuits - Class B (1)
Microcomputers (1)
Microcomputers - Symbols (1)
MicroDIMM (2)
Microelectronic (1)
Microelectronic Applications (1)
Microelectronic Packages - Ceramic (1)
Microprocessors (1)
Microprocessors - Symbols (1)
microwave (1)
MIL-STD-883 (1)
Military Practices (1)
Military Semiconductor Devices - Distributor Requirements (1)
Mini (4)
Mini DIMM (2)
Mini Tray (2)
MiniDIMM (3)
MiniRDIMM (1)
MIPI (1)
Mitigation (1)
MM (2)
MMC (11)
MMC card mechanical removable non-volatile flash memory device using the MMC interface version 4.2 (1)
MMCA (3)
MMCmicro (1)
MMCmobile (1)
MMCplus (1)
MMIC Life Testing (1)
MO-309 (1)
Mobil (1)
Mobile (1)
Mode (1)
Model Development (1)
modeling (4)
Modeling - Bond Wire (1)
module (33)
Module configurations (1)
Modules (1)
Moisture (2)
Moisture Resistance (1)
Moisture Sensitive - Symbol and Labels (1)
Moisture Sensitivity (1)
Moisture-Induced (1)
Mold Flash (3)
Monitoring (1)
Monolithic (1)
Monolithic Processing Technologies (1)
Monotonic (1)
Mos (3)
MOSFET (2)
MOSFETs (2)
MPDRAM (1)
MPGA (1)
MQFP (1)
MQUAD (1)
mSATA (2)
Multi Chip Module (1)
Multi Media (1)
Multi Media Card (3)
Multi-bus (1)
Multi-Chip (1)
Multi-row (2)
Multibus (1)
Multichip (1)
Multichip Module (2)
multimedia (1)
MultiMediaCard (1)
Multiple Data Partitions (1)
N-Channel (1)
N-Channel MOSFET (1)
NAND (3)
National Electronic Process Certification (1)
Natural Convection (Still Air) (1)
NBTI (1)
NCVE (1)
Negative Bias (1)
neuton (1)
NFET Switch (2)
Nibble Wide (3)
Nibble Wide PROM (1)
Nibble Wide SRAM (1)
NMOS (1)
NMOS FET (1)
no lead (14)
No-lead (9)
Noise Detection - Particle Impact (1)
Noise Figure Measurement (1)
Noise Margin Measurements (1)
Noise Voltage (1)
Noise Voltage Measurement (1)
Nominal Supply Voltage - 2.5 V (1)
Non-Leaded (2)
Nonconductive (1)
Nonhermetic (2)
Nonterminated (1)
Nonterminated - Digital Integrated Circuits (2)
Nonvolatile (1)
Nonvolatile Memories (1)
Nonvolatile RAM (1)
NOR (1)
Normal Range (2)
Normal Range - Power Supply Voltage (2)
Numbering - Liked Named Terminal Functions (1)
NVM (3)
NVRAM (1)
One Byte (1)
Ongoing Process Analysis (1)
Operating Life (1)
Operating Voltages (1)
Operating Voltages - ECL (1)
Operation (1)
Operator Training - PIND Testing (1)
Opportunity Assessment (1)
Optimization (1)
Optional Features (1)
Optoelectronic (1)
Organic Materials (1)
outlier (1)
Outlier Identification (1)
Outline Drawings - Solid State Products (1)
Output (1)
Output Buffer Supply Voltage (1)
Output Drivers (1)
Oven Temperature (1)
Overshoot (1)
overview (2)
P-Channel (1)
P-Channel - MOSFET (1)
package (10)
Package Designators (1)
Package Height (1)
PACKAGE PINOUTS (1)
Package-on-Package (3)
Packages (1)
Packages - Semiconductor Devices (1)
Packing (1)
Page Size (1)
Parametric Failure (1)
Parametric Shift (1)
Parity (4)
Particle Getters (1)
Parts Per Million (PPM) - Quality Assessment (1)
Parts Selection (1)
Pb (1)
Pb based (1)
Pb-free (3)
Pb-free solder bump (1)
PBGA (3)
PC133 (4)
PC1600 (4)
PC2-3200 (2)
PC2-4200 (2)
PC2-5300 (3)
PC2-6400 (3)
PC200 (1)
PC2100 (4)
PC266 (1)
PC2700 (4)
PC2700/PC3200 (1)
PC3 (1)
PC3-10600 (6)
PC3-12800 (7)
PC3-14900 (1)
PC3-17000 (1)
PC3-6400 (6)
PC3-8500 (6)
PC3200 (3)
PCB (1)
PCN - Product Chance Notification (1)
PDSO (1)
PEMM Families (1)
Performance (2)
Performance Parameters - CMOS Devices (1)
Peripheral (1)
Peripheral Leaded (1)
Peripheral Terminals (3)
Persson and Rootzen Method (1)
PGA (2)
Photoconductive Cells (1)
Phy (1)
Physical Dimensions (1)
Physics of Failure (1)
PIND - Particle Impact Noise Detection (1)
pinout (3)
Pinout Logic (1)
Pinouts (4)
Plane (1)
Plasitc (1)
Plasma-Process (1)
plastic (51)
Plastic - Encapsulated Microcircuits (1)
Plastic Surface Mount (1)
PLCC (3)
PLL (9)
PLL Clock Driver (1)
PMOS (2)
POD (4)
POD-12 (1)
POD-15 (1)
POD-18 (1)
POD135 (1)
POD15 (1)
POD18 (1)
Polymeric Material (1)
Polyvunyl Chlorid (1)
PoP (4)
Potential Contributors (1)
Power (4)
Power Control Modules (1)
Power Cycle (1)
Power MOSFET (1)
Power MOSFET Drain-Source Diodes (1)
Power MOSFETs (1)
Power MOSFETs - Dose Rate (1)
Power package (5)
Power Supply Interface (1)
Power Supply Voltage - Wide Range (1)
Power Transistors (1)
Power Transistors - Low Frequency (1)
Power Transistors - Maximum Rating Verifications (1)
PQFN (1)
PQFP (3)
pre-SMT (1)
Preconditioning (1)
Preconditioning of Plastic Surface Mount Devices (1)
Preferred Values - Small Signal Diodes (1)
Preparation of Outline Drawings (1)
Presence (2)
Press Fit (3)
Probe - Pad Sizes and Layouts (1)
Problem Analysis (1)
Procedures (1)
Process Characterization. Problem Solving Tools (1)
Procurement Quality (1)
product (1)
Product Discontinuance (1)
Product Elimination - Maverick (1)
Product Life Cycle - PLC (1)
Product Reliability - Latch-up (1)
Product-Documentation Classifications (1)
Product/Process Changes (1)
Profile (1)
Profile Height Codes (1)
Programmable Devices (1)
Programmable Language (1)
Programmable Logic Device (1)
Programming Failure (1)
Protocol (1)
proton (1)
Pseudo-Static RAM (1)
PSIP (1)
PSO-N (1)
PSO-N/PQFN (1)
PSOF (2)
PSOF-2 (1)
PSRAM (2)
PTH (1)
PTP Link (1)
Pull (1)
Punch-Singulated (2)
PVC (1)
Q Measurement (1)
QCI Optimization (1)
QFN (7)
QFP (5)
QFP-N (2)
Quad (21)
Quad Flat (3)
Quad Flat pack (2)
Qual Flatpack (1)
Qualification (5)
Qualification of Silicon Devices (1)
Quality (1)
Quality and Reliability - Standards and Publications (1)
Quality Levels - Outgoing (1)
Quality System Assessment (1)
Quick Reference Guide (1)
R-PDSO-G (4)
R-PDSO-G/TSOP11. (1)
R-PSFM (1)
R-PSFM-F (1)
R-PSFM-G (1)
R-PSIP-F3 (1)
R-PSIP-Fxx (1)
R/C (4)
R/C AB (1)
R/C F. SDRAM (1)
R/C H (2)
R/C W (1)
R/C Y (1)
radiation (3)
Radiation-Hardness (1)
Radio (2)
RAM (6)
RAM - Random Access Memory (1)
Rating (1)
Raw Card A (1)
Raw Card A0 (1)
Raw Card B0 (1)
Raw Card C (2)
Raw Card E (1)
RB-DP (1)
RC (2)
RDF (1)
RDIMM (32)
Real-Time (1)
Receiver Type (1)
Receiving Inspection (1)
Rectangle (1)
Rectangular (18)
Rectangular Die-Size (1)
Rectifier Diodes (2)
Rectifier Stacks (1)
Reference Board (1)
Reflow (3)
Refresh Control (1)
Refresh Operation (1)
Register (10)
Registered (4)
Registered Buffer (6)
Registered DDR DIMM Applications (1)
Registration (1)
Registration Format (1)
Registration List - Solid State Products (1)
Registration Procedures (1)
Regression Plane (1)
release 22 (1)
Reliability (6)
Reliability Models (1)
Reliability Monitoring (2)
Reliability Monitoring - Electrostatic-Discharge Sensitive Devices (1)
Reliability Monitoring - Requirements (1)
Reliability Test Method (1)
Reliabilty (1)
reliable (1)
Repair (1)
Report Format - Failure Analysis (1)
Reporting (1)
Reset Signal (1)
Residual (1)
Resistance - Thermal for Signal /Regulator Diodes (1)
Retangular (1)
Reverse Recovery Characteristics - Silicon Diodes (1)
Reverse Recovery Time - Measurement of (1)
Reverse Recovery Time - Signal Diodes (1)
RF Admittance Bridge (1)
RF-BB (2)
RFIC (1)
RFID (1)
RL-PLGA (2)
ROM DIMM (1)
Round Lead (1)
RT-PLGA (1)
Rugged Applications (1)
S-PBGA (1)
S-PXGA-X (1)
Salt Atmosphere (1)
SATA (1)
Scalable (2)
Scalable Signaling (1)
Scattering Parameters (1)
Schmitt Trigger (1)
Scope (1)
Screening (2)
Screw Mont (1)
Screw Mount (1)
SDR (2)
SDR-Flash (1)
SDRAM (53)
SDRAM. SPD (1)
Seatin Plane (1)
Semiconductor (1)
Semiconductor Device Failure (1)
Semiconductor Devices - Designation System (1)
Semiconductor Power Control Modules - SPCM (1)
Semiconductor Suppliers - User Notification (1)
Semicustom Design - ASIC (1)
Semicustom Integrated Circuits (2)
Senselines (1)
Sensitivity Testing (2)
Sensor (2)
Sequence Order (1)
SER (3)
Serial (4)
Serial Data (1)
Serial Interface (1)
Serial Presence (2)
Serial Presence Detect (3)
SGRAM (8)
SGRAM/SDRAM (1)
Shear (1)
Shelf (1)
Shelf life (1)
Shipping (18)
Short Circuit Withstand Time (1)
Shrink (4)
Signal Diodes (3)
Signal Names (1)
Signature Analysis (1)
Silicon Diodes - Reverse Recovery Characteristics (1)
Silicon Pad (1)
SIMM (3)
Single (1)
Single Interconnect Array (1)
Single Semiconductor Device (2)
Single-Event Effects - SEE (1)
Singly Right - Censored Data (1)
Sinusoidal Signal-Generator Method (1)
SIV (2)
Sixteen Byte (1)
Skew (1)
Skew Specification (1)
SKT (1)
sleep (1)
Sleep Mode (1)
Slim. Lite (1)
SLVS (1)
Small (16)
Small outline (15)
Small Scale (1)
Small Signal - Preferred Values (1)
Small Signal Transistors (1)
Small Signal VHF-UHF (2)
Small Values - Transistor Capacitance (1)
SMD (1)
SMT (2)
SMT DIMM (1)
SMT. DDR3 (1)
Sn whisker theory (1)
SO (2)
SO-004 (1)
SO-016 (1)
SO-017 (1)
SO-019 (1)
SO-CDIMM (1)
SO-DIMM (12)
SO-RDIMM (1)
SO-UDIMM (2)
Socket (14)
Socket Outline (2)
SODIMM (9)
SOF (1)
soft error (2)
Soft Error Rate (2)

SOIC (7)
SOJ (2)
Solar Cells (1)
Solder (2)
solder bump (2)
Solder Joint Reliability (1)
Solder Reflow Operations (1)
Solder Shock (1)
Solder void (1)
Solder Wave (1)
Solderability (2)
Solderability Testing - Dip and Look (1)
Solid State Components - Procurement Quality (1)
Solid State Drive (2)
Solid State Products - Registration List (1)
Solvents (1)
SON (1)
SOP (6)
SOT (1)
Space Vehicle Service (1)
SPC System (1)
SPD (10)
Specification (1)
Spectral Response Curves (1)
sport (1)
Square (19)
Square Outlines (1)
SRAM (13)
SSD (5)
SSOP (2)
SSTE (1)
SSTE32882 (1)
SSTL - SSTL_2 (1)
SSTL_18 (3)
SSTL_2 (4)
SSTL_3 (1)
SSTU (10)
SSTU32864 (1)
SSTU32865 (2)
SSTU32866 (1)
SSTU32D868 (1)
SSTU32D869 (1)
SSTU32S868 (1)
SSTU32S869 (1)
SSTUA (1)
SSTUA32865 (1)
SSTUA32866 (1)
SSTUA32D865 (1)
SSTUA32D868 (1)
SSTUA32S865 (1)
SSTUA32S868 (1)
SSTUB (3)
SSTUB32869 (1)
SSTV (1)
SSTV16857 (1)
SSTV16859 (1)
SSTV32852 (1)
SSTVN16859 (1)
Stack (1)
Stackable (1)
Stacked (6)
Stacked DDR (1)
Stacking Module (1)
Staggered (5)
Standard Capacity (1)
Standard Practices (1)
Standard Practices and Procedures (1)
STAPL (1)
Static Phase Offset (1)
Statistical Process Control - SPC (1)
Statistical Reliability Monitoring - SRM (1)
Storage (2)
Storage Life (2)
Strain gage test (1)
Straps (1)
Stress (1)
Stress Migration (1)
Stress Migration - Voiding (1)
Stress Sensitivity (1)
Stress Test (2)
Stress Test Driven Qualification of ICs (1)
Stress Voiding (1)
Stress-Induced-Voids (1)
Stress-Test-Driven (1)
Stub Series (1)
Stub Series - Terminated Logic (2)
Style Manual (1)
Subassembly (1)
Suface Mounted (1)
Super (1)
Super thin (4)
Superset Memory Types (1)
Supplementary Design (1)
Supplier (2)
Supplier Management (1)
Supply Voltage (2)
Support Logic (1)
Suppressor - Transient Voltage (1)
Suppressors (1)
Surface Finished (1)
Surface Finishes (1)
Surface Mount (8)
Surface Mount Header (1)
Surface Mounted (1)
Surface-Mount Components (1)
Surge Protective Device (1)
Susceptibility (1)
SWEAT (1)
Switching - Inductive (1)
Switching Loss (1)
Switching Method (2)
Switching Parameters (1)
Switching Parameters. DIMM (1)
Symbol - Electrostatic Sensitive Devices (1)
Symbol - Moisture Sensitive (1)
Symbol Grade (1)
Symbols (1)
Symbols - Analog-to-Digital (1)
Symbols - Discrete Devices (1)
Symbols - Optoelectronic Devices (1)
Symbols - Quick Reference Guide (1)
Symbols - Quick Reference GuideData Sheet Disclaimers (1)
Symbols - Voltage Suppressors (1)
Synchronous (1)
Synchronous DRAM (2)
Synchronous RAM (1)
Syncronous (1)
System (1)
T-PSOF (1)
T-PSOF-3 (1)
T-PSON-3 (1)
Table of Contents (1)
Tape (2)
TBGA (2)
TDDB (1)
Technology Qualification (1)
Temperature (4)
Temperature Coefficient - Resistance (1)
Temperature Coefficient - Voltage Regulator Diodes (1)
Temperature Cycling (3)
Temperature Humidity (1)
Temperature Measurement (1)
Temperature Range (1)
Temperature Stress (1)
Template (1)
Tempurature (1)
Tensile Pull (1)
Terminal Position Numbering (1)
Terminals (1)
Terminated Logic (1)
Terminations (1)
Terms (2)
Terms and Definitions - Analog-to-Digital (1)
Terms and Definitions - Binary Integrated Circuit (1)
Terms and Definitions - Cell-Based (1)
Terms and Definitions - Digital-to-Analog (1)
Terms and Definitions - Discrete Devices (1)
Terms and Definitions - Gate Array (1)
Terms and Definitions - Index (1)
Terms and Definitions - Low Frequency Power Transistors (1)
Terms and Definitions - Memory Integrated Circuits (1)
Terms and Definitions - Microcomputers (1)
Terms and Definitions - Microelectronics (1)
Terms and Definitions - Microprocessors (1)
Terms and Definitions - Optoelectronic Devices (1)
Terms and Definitions - Power MOSFETs (1)
Terms and Definitions - Voltage Suppressors (1)
Terrestrial (1)
Test (1)
Test Method - Unbiased Autoclave (1)
Test Board (2)
Test Board - Leaded Surface Mount (1)
Test Criteria - Thin Dielectrics (1)
Test Design (1)
Test Loading (1)
Test Loads (1)
Test Method (6)
Test method - Application Specific (1)
Test Method - Backside External Visual (1)
Test Method - Beam Accelrated Soft Error Rate (1)
Test Method - Board Level Cycle bend (1)
Test Method - Board Level Drop Test (1)
Test Method - Circuit Support Films (1)
Test Method - Collector-Base Time Constant (1)
Test Method - Coplanarity (1)
Test Method - Cycled Temperature Humidity (1)
Test Method - Dose Rate (1)
Test Method - EEPROM (1)
Test Method - Electrical (1)
Test Method - Environmental Conditions (3)
Test Method - ESD Human Body Model (1)
Test Method - ESD Machine Model (1)
Test Method - External Visual (1)
Test Method - Field-Induced Charged-Device Model (1)
Test Method - Gate Charge (1)
Test Method - Gate Resistance (1)
Test Method - HAST (1)
Test Method - Hermeticity (1)
Test Method - High Temperature Storage (1)
Test Method - Hot Carrier (1)
Test Method - Humidity Bias Life (1)
Test Method - LCD (1)
Test Method - Lead Integrity (1)
Test Method - Low Temperature Storage Life (1)
Test method - Mark legibility (1)
Test Method - Marking Permanency (1)
Test Method - Mechanical Shock (1)
Test Method - Moisture Diffusivity (1)
Test method - Particle Getters (1)
Test Method - Photoconductive Cells (1)
Test Method - Physical Dimension (1)
Test Method - Plastic Surface Mount Preconditioning (1)
Test Method - Polymeric Materials (1)
Test Method - Power Cycling (1)
Test Method - Power Device Turn-Off Switching Loss (1)
Test Method - Power MOSFET Drain-Source Diodes (1)
Test Method - Repetitive Inductive Load Avalanche Switching (1)
Test Method - Resistance to Solder Shock (1)
Test Method - Salt Atmosphere (1)
Test Method - Short Circuit Withstand Time (1)
Test Method - Single Pulse UIS Avalanche Test (1)
Test Method - Soft Error Rate (1)
Test method - Solder Ball Pull (1)
Test Method - Solder Ball Shear (1)
Test Method - Solderability (1)
Test Method - Subassembly Mechanical Shock (1)
Test Method - Temperature Cycling (1)
Test Method - Thermal Shock (1)
Test Method - Thyristors (1)
Test Method - Vibration (1)
Test Method - Water Solubility (1)
Test method - Whisker Growth (1)
Test Method - Wire Bond Shear (1)
Test Methodology (1)
Test Methods (1)
Test Practices (1)
Test qualification (1)
Test Structure - Thin Dielectrics (1)
Test trace (1)
Test Window (1)
Testability Guidelines (1)
Testing (1)
TFBGA (1)
TFI-PBGA (1)
TFR-XBGA (3)
THB (1)
thermal (12)
Thermal Characteristics - Power MOSFETs (1)
Thermal Conductivity (1)
Thermal Enhancement (1)
Thermal Enhancements (1)
Thermal Impedance Measurements - Bipolar Transistors (1)
Thermal Impedance Measurements - IGBT (1)
Thermal Impedance Measurements - Vertical Power MOSFETs (1)
Thermal Measurement (1)
Thermal Measurement - Component Packages (1)
Thermal Measurement - Integrated Circuit (1)
Thermal Measurements (2)
Thermal Pad (1)
Thermal Resistance (1)
Thermal Resistance - Bridge Rectifier Assemblies (1)
Thermal Resistance - GaAs FETs (1)
Thermal Resistance - Signal and Regulator Diodes (1)
Thermal Resistance Measurement - Conduction-Cooled Power (1)
Thermal Sensor (2)
Thermal Sensor. Platform (1)
Thermal Shock (2)
Thermal Test (2)
Thermal Test Board (1)
Thermal Test Chip (1)
Thermal. Stress (1)
Thermally (1)
Thermally Enchanced (1)
thermally enhanced (15)
Thermally Tabbed Packages (1)
Thermocouple (1)
Theta-JA (1)
Thick (1)
Thick Matrix (1)
Thin (14)
Thin Dielectrics (3)
Thin Gate Oxides (1)
Thin Grid Array (1)
Thin Matrix (1)
Thin Matrix Tray (6)
Thin profile (4)
thorium (1)
Through-Hole Mounted Devices (1)
Through-Hole Packages (2)
Through-Silicon Via (1)
Thyristor Surge Protective Device - TSPD (1)
Thyristor Test Methods (1)
Thyristors (3)
Time to Failure (1)
TIME-DEPENDENT (1)
Time-Dependent Dielectric Breakdown (1)
Timing Diagrams - B Series CMOS Devices (1)
Timing Failure (1)
Tin (2)
Tin (Sn) (1)
Tin Alloy (2)
Tin Ally (1)
Tin Whisker (1)
Tin Whiskers (1)
TOC (4)
Tolerancing (1)
Transient (1)
Transient Voltage Suppressor (1)
Transistor (4)
Transistor - AC Stability (1)
Transistor - Capacitance (1)
Transistor Admittance Parameters (1)
Transistor Capacitance (1)
Transistor Lead Temperature (1)
Transistor Short-Circuit (1)
Transistors (2)
Transistors - Conduction Cooled (1)
Transistors - Noise Figure Measurement (1)
Transistors - Field-Effect (1)
Transistors - Insulated Bipolar Gate (1)
Transistors - Low Power Audio Frequency (1)
Transistors - Power Gain (1)
Transistors - Power MOSFETs (1)
Transistors - Small Signal (1)
Transistors - Thermal Characteristics (1)
Tray (4)
TRD (1)
TS (1)
TS3000 (1)
TSE (1)
TSE2002 (3)
TSOP (4)
TSOP II (1)
TSOP-Based (1)
TSOP-I (1)
TSOP2 (1)
TTl (3)
TTL Compatible - BiCMOS Logic Devices (2)
TTL Compatible - CMOS Devices (1)
TTL Compatible - Control Inputs (1)
TTL Compatible Logic (1)
Tubes (1)
Turn-Off Switching Loss (1)
Two Byte (1)
two resistor (1)
Type 1 (1)
Type Assignments (1)
Type Designation (1)
Type Designations (1)
UDIMM (2)
UFS (2)
UHF (1)
Ultra (2)
Ultra Thin (5)
ULTRA-THIN (1)
ultralow-k (1)
Unbiased HAST (1)
unbuffered (14)
Unbuffered DIMM (2)
Uncensored Data (1)
Unclamped Inductive Switching (UIS) (1)
Updates (2)
Upper (1)
User Notification (1)
V (1)
V-PSOF (1)
Validation Design (1)
Values - Device Specifications (1)
Values - Small Signal and Regulator Diodes (1)
variation (1)
Variations (1)
VCSDRAM (1)
Vdd (1)
Vector Network Analyzer (1)
Vendor ID (1)
Verification (1)
Vertical Power MOSFETs (1)
Very (1)
Very Low Profile (1)
Very Thick (1)
very thin (18)
Very Thin Profile (1)
Very Very Thin (8)
Very-Very Thin (2)
VF-PQFN (1)
VF-XBGA (3)
VFBGA (1)
VFR-XBGA (2)
VHF (1)
Via (1)
Vibration (1)
Virtual Channel (1)
Visual (1)
VLP (4)
VLP-RDIMM (1)
Voltage (1)
Voltage Level Translation (1)
Voltage Logic Levels (1)
Voltage Regulator Diodes (1)
Voltage-Variable-Capacitance (1)
W)F-PQFN (1)
W)F-PSON (1)
Wafer (1)
Wafer Level (2)
Wafer Level Electrical Testing (1)
Wafer Level Reliability (1)
Wafer-Level (1)
Wafer-Level Testing (3)
Warehouse (1)
Warpage (1)
Wavesolder (1)
WCSP Logic (1)
Weapons (1)
Wearout (1)
WF-PFQN (1)
Wide Body (1)
Wide I/O (2)
Wide Range (3)
Wide Range - Power Supply Voltage (2)
WideIO (1)
Wire Bond Shear (1)
Wire Bond Type Chip (1)
Wireless (1)
Wires (1)
Wiring diagram (1)
Withstand Time - Short Circuit (1)
WLBGA (1)
Word Wide (4)
Word Wide Graphics (1)
Word Wide PROM (1)
Word Wide ROM (1)
Workload (1)
WR-PDSO1 (1)
Write (1)
WSOP1 (1)
X-ray (1)
X1F-XLGA. LGA (1)
XBGA (3)
XFBGA (1)
XRF Technolgy (1)
Zener (1)
Zero Delay Buffer (1)
ZIP (1)

User login

Standards and Documents Assistance

Contact Julie Carlson, 703-624-9230