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countable failure
A failure due to an inherent defect in an electronic device during early-life-failure (ELF) stress tests.
NOTE Failures due to electrical overstress (EOS), electrostatic discharge (ESD), mechanical damage, etc., are not counted, but the failing devices are considered to have completed testing through the last successful readout when computing device-hours.
References
JESD74A, 2/07Browse Alphabetically
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