comparison unit (CU)

(1) The change in a temperature-sensitive parameter divided by the change in a dependent heating-condition parameter.

(2) For an integrated circuit, the change in temperature-sensing diode forward junction voltage under measurement conditions divided by the change in heating current, ΔVFIH. This allows for thermal comparison of one device to another when the heating voltage remains constant.

References

JESD51-1, 12/95

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