Dictionary: JESD88

JEDEC publishes a Dictionary of Terms for Solid State Technology, JESD88. Its purpose is to promote the uniform use of terms, definitions, abbreviations, and symbols throughout the solid state industry. The terms and definitions from JESD88 are provided here for quick search. Please note that the searchable version of JESD88 on this page has not yet been updated to align with the latest version of JESD88, published in June 2013. For the most up to date information, download the PDF version of JESD88E.

The more positive (less negative) limit of a range of some quantity.

JESD99B, 5/07

The less positive (more negative) limit of a range of some quantity.

JESD99B, 5/07

The logic state represented by the binary number 0 and usually standing for an inactive or false logic condition. (Ref. ANSI/IEEE Std 91.)

JESD99B, 5/07

The logic state represented by the binary number 1 and usually standing for an active or true logic condition. (Ref. ANSI/IEEE Std 91.)

JESD99B, 5/07

A label that contains data in two dimensions as either stack or matrix types.

NOTE    This was originally published as “2D code label (matrix)”.

J-STD-609, 5/07

A label that contains data in two dimensions as either stack or matrix types.

NOTE    This was originally published as “2D code label (matrix)”.

J-STD-609, 5/07

The interconnection made by the attachment of the device or component to the printed circuit board.

JESD97, 5/04

A label that identifies boxes, bags, or containers that contain boards, assemblies, or components having or capable of providing Pb-free 2nd‑level interconnects.

NOTE This label includes the Pb-free category and maximum processing temperature.

JESD97, 5/04

The material at the component 2nd level termination.

NOTE    Depending on the component type, this material could refer to the terminal finish or ball material.

J-STD-609, 5/07 

A

See "port A; port B".

See "address inputs".

See "acoustic data, A-mode"

See "anode terminal".

A shortened form of a word or expression.

JESD77-B, 2/00
JESD99B, 5/07
ABD

See “avalanche breakdown diode”.

A device having three or more terminals and containing multiple diodes within a single package, with at least one of the diodes being an ABD.

NOTE    ABD arrays can be classified as 1) devices with multiple discrete semiconductor chips; and 2) devices with multiple diode junctions diffused into a single semiconductor chip.

JESD77C, 10/09
JESD210, 12/07

Synonym for "total error".

JESD99B, 5/07

The maximum junction temperature of an operating device, beyond which damage (latent or otherwise) may occur.

JESD22-A108C, 6/05

The maximum junction or ambient temperature of an operating device as listed in its data sheet and beyond which damage (latent or otherwise) may occur.

NOTE Manufacturers may also specify maximum case temperatures for specific packages.

JESD89-3, 9/05

The maximum voltage that may be applied to a device, beyond which damage (latent or otherwise) may occur.

JESD22-A108C, 6/05
JESD89-1, 6/04
JESD89-2, 11/04
JESD89-3, 9/05

User login

Enter the password that accompanies your username.
Please note: passwords are now case-sensitive.

Browse Alphabetically

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

Standards and Documents Assistance

Contact Julie Carlson, 703-624-9230

Dictionary RSS Feed

Subscribe to the JEDEC Dictionary RSS Feed to receive updates when new dictionary entries are added.