ROCS Workshop   (Formerly the GaAs REL Workshop)
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Call for Papers
 
The annual workshop on Compound Semiconductor Reliability will be held one day before the
Compound Semiconductor MANufacturing TECHnology Conference
with the objective of bringing together researchers, manufacturers, & users of compound devices.
Papers presenting the latest results and new developments in all phases of compound semiconductor reliability are solicited.  
Original papers discussing work in progress and emerging device technologies are acceptable and encouraged. 
Topics of interest include:
Failure Mechanisms               Circuit Reliability                        Reliability Modeling
Metallization Studies            Cost of Reliability                        Thermal Analysis
   Electromigration                 Quality Assurance                    Accelerated Testing
Materials Defects             Reliability Standards                   Radiation Effects
     Drift, Backgating                    Ionic Migration                  Novel Device Problems
ESD/EOS/Pulse Burnout           Hot Electron Effects            Environmental Effects 

Details  =  Call for Papers PDF


Reliability Of Compound Semiconductors Workshop
Sponsored by JEDEC Committee JC-14.7