| ROCS Workshop (Formerly the GaAs REL Workshop) | ||||||||||||||||||||
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| Call for Papers |
| The annual workshop on Compound Semiconductor Reliability will be held one day before CSICS (the GaAs IC Symposium) with the objective of bringing together researchers, manufacturers, & users of compound devices. Papers presenting the latest results and new developments in all phases of compound semiconductor reliability are solicited. Original papers discussing work in progress and emerging device technologies are acceptable and encouraged. Topics of interest include: |
| Failure Mechanisms
Circuit
Reliability
Reliability Modeling Metallization Studies Cost of Reliability Thermal Analysis Electromigration Quality Assurance Accelerated Testing Materials Defects Reliability Standards Radiation Effects Drift, Backgating Ionic Migration Novel Device Problems ESD/EOS/Pulse Burnout Hot Electron Effects Environmental Effects |
| Call for Papers PDF |
Reliability Of Compound
Semiconductors Workshop |