JC-14 is responsible for standardizing quality and reliability methodologies for solid state products used in commercial applications such as computers, automobiles, telecommunications equipment, etc. It also includes developing standards for board-level reliability of solid state products used in commercial equipment.
The committee is comprised of both suppliers and users and furnishes a forum where concerns of the industry for solid state device quality and reliability issues can be resolved. The committee maintains liaisons with other JEDEC committees whose tasks are related to quality and reliability issues. In addition, the committee coordinates activities with other standards organizations such as IPC, IEC, and JEITA to help develop industry and worldwide standardization.
Find JC-14’s complete scope in JM18: JEDEC Committee Scope Manual.
|3D CHIP STACK WITH THROUGH-SILICON VIAS (TSVS): Identifying, Evaluating and Understanding Reliability Interactions||JEP158||Nov 2009|
|A PROCEDURE FOR EXECUTING SWEAT:||JEP119A||Aug 2003|
|A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS:||JESD28-A||Dec 2001|
|A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS:||JESD60A||Sep 2004|
|A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES||JESD90||Nov 2004|
|ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE||JESD22-A102D||Nov 2010|
|ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST||JESD22-A118A||Mar 2011|
|ADDENDUM No. 1 to JESD35 - GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS:||JESD35-1||Sep 1995|
|ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS:||JESD35-2||Feb 1996|
|APPLICATION SPECIFIC QUALIFICATION USING KNOWLEDGE BASED TEST METHODOLOGY:||JESD94A||Jul 2008|
|JC-14.1||Reliability Test Methods for Packaged Devices|
|JC-14.3||Silicon Devices Reliability Qualification and Monitoring|
|JC-14.4||Quality Processes and Methods|
|JC-14.7||Gallium Arsenide Reliability and Quality Standards|